Particle classifier (PACLA)

Automated single particle scanning electron microscopy analysis coupled to energy dispersive x-ray spectroscopy (SEM/EDX) deliver multidimensional and very complex data sets making data treatment tedious and time consuming.

In the past, the classification of the different morpho-chemical groups, which can be related to specific sources, was done manually.

In order to overcome this issue, we have developed in cooperation with the Zürich School of Applied Sciences and the University of Fribourg an extremely useful tool for efficient data treatment.

Here, we present the prototype of the so called PACLA (PArticle CLAsifier software), which enables an arbitrary number of particles to be efficiently analyzed and grouped in chemical classes (=sources) based on cluster analysis.


The Sigma-Z device enables automatization of sampling intervals for particle passive sampling


Sampling adhesive surfaces for the Sigma-2 passive sampler

  • Adhesive surface for optical microscopy
  • Standard adhesive surface for scanning electron microscopy (element range: Na-Pb)
  • Premium adhesive surface for scanning electron microscopy (element range: C-Pb)
  • Adhesive surface for asbestos sampling after VDI 3492

Sigma-2 passive sampler

The Sigma-2 passive sampler is suitable for the collection of particles between 2.5 and 80 µm in diameter.

The particles are deposited following the sedimentation principle. The required sampling devices can be purchased or rented.

We also offer you the consumable material necessary for the operation of the devices.

Particle Vision Network